Friday, January 10, 2020

FOOD SAFETY MEET 2020

About Conference


Food Safety Meet 2020

Theme: “New Innovations in Food Technology and Research.”

Update your skills, enhance your knowledge base, and broaden your horizons- all in one place!

Date: June 09-10, 2020
Venue: Istanbul, Turkey

Food Safety Meet 2020 invites all the participants from all over the world to attend the 3rd International Conference on Food Safety and Health which is to be held in Istanbul, Turkey during June 09-10, 2020.
This includes keynote presentations, Oral talks, Poster presentations, Video presentation, and Exhibitions.
Food Safety Meet 2020 highlights the theme“New Innovations in Food Technology and Research.” This will broadly cover the fields of Food Safety as well as for initiation of new prospects and to explore new tendencies in the field of Health.

Why to attend Food Safety and Health Conference 2020?

Our aim is to the corporate community and to create a platform for the exchange of information on technological developments, new scientific modernization and the effectiveness of various regulatory programs towards Food Safety Meet 2020. The application of Molecular Approaches in all aspects of the modern Food Science and Health field. This conference also focuses on a wide variety of current research on food safety and health that have both beneficial and deleterious effects on the safety and quality of foods, and are thus a concern of public health.
This is the finest opportunity to interact with participants from the Food Safety, Health associations & Food Biotechnology, Associations, Food Safety Societies, and Food Science Academicians. It mainly concerns on the modern impact and technologies in Food Safety and other relevant to Food Sciences, as well as for initiation of new assessments and technologies and the effectiveness of various regulatory programs on Food Chemistry towards Food Safety Meet 2020 conducts presentations, share knowledge, meet with present potential and eminent scientists, and receive name recognition at this two days event.


Special Issues


  •  All accepted abstracts will be published in respective Supporting International Journals.
  •  Abstracts will be provided with Digital Object Identifier by Cross Ref.